RLK656/656D Benchtop DHR Infrared Emission Meter Single / Dual‑Band RS‑485 Remote Control Lab OEM

1. Introduction

RLK656 and RLK656D are benchtop-type infrared emission meter built upon Directional Hemispherical Reflectance (DHR) testing principle. RLK656 supports single-band selection between 3-5 μm and 8-14 μm, while RLK656D enables simultaneous dual-band measurement for both wavebands. All functional assemblies are integrated inside the main controller to deliver stable operation and superior measurement repeatability. Equipped with RS-485 communication port and serial control commands, the instrument allows secondary development and seamless integration into automated test systems. It features 3.5-inch TFT touch-screen and EEPROM memory for storing 32 latest measurement records. Powered by 220VAC mains supply, these instruments are widely deployed in laboratory material research, surface-property evaluation and institutional inspection departments, and can also serve for teaching demonstrations.

2. Advantages

1. Adopts DHR directional-hemispherical reflectance principle with fixed 20°±1° incident-angle
2. Two model variants: RLK656 for selectable single-band; RLK656D for simultaneous 3-5μm & 8-14μm dual-band acquisition
3. Measuring range 0.01-0.99, excellent repeatability ≤0.01, display resolution up to 0.001
4. Fast measurement within 10 seconds; warm-up time less than 180 seconds for lab-based workflows
5. Integrated benchtop construction, high mechanical stability suited for long-duration continuous measurement
6. 3.5-inch TFT LCD touch-screen for straightforward local operation and parameter review
7. EEPROM onboard memory saves latest 32 measurement records to facilitate result comparison
8. RS-485 communication with serial command set, supporting PC remote control and secondary system integration
9. Strict sample requirement: specimen diameter＞30 mm and must be infrared-non-transparent
10. Compact desktop footprint 320×280×200 mm, weight ≤4Kg, works reliably at -10℃~+45℃ non-condensing environment

3. Technical Specifications

Note: Technical indicators are for reference only. Refer to the delivered product manual. Specifications are subject to change without prior notice.

4. Applications

Laboratory-grade material emissivity testing, material-surface performance evaluation, quality-inspection institute routine checking, university teaching and principle demonstration

5. Product Appearance

6. FAQs

Q1: What is the difference between RLK656 and RLK656D?

A: RLK656 supports single-band selection of either 3-5μm or 8-14μm; RLK656D supports simultaneous dual-band measurement for both wavebands.

Q2: What communication interface is available for integration?

A: RS-485 interface with serial command control for remote operation and secondary development.

Q3: What sample specifications are mandatory for testing?

A: Samples need diameter over 30 mm and shall be infrared-non-transparent.

Q4: How many test records can the instrument store locally?

A: EEPROM can store up to 32 latest measurement records.